DocumentCode :
1277545
Title :
Germanium as a versatile material for low-temperature micromachining
Author :
Li, Biao ; Xiong, Bin ; Jiang, Linan ; Zohar, Yitshak ; Wong, Man
Author_Institution :
Dept. of Electr. & Electron. Eng., Hong Kong Univ. of Sci. & Technol., Hong Kong
Volume :
8
Issue :
4
fYear :
1999
fDate :
12/1/1999 12:00:00 AM
Firstpage :
366
Lastpage :
372
Abstract :
Though germanium (Ge) shares many similar physical properties with silicon (Si), it also possesses unique characteristics that are complementary to those of Si. The advantages of Ge include its compatibility with Si microfabrication, its excellent gas and liquid phase etch selectivity to other materials commonly used in Si micromachining, and its low deposition temperature (<350°C) that potentially allows Ge to be used after the completion of a standard CMOS run. Wider applications of Ge as a structural, sacrificial, and sensor material require a more systematic investigation of its processing and properties. The results of such an undertaking are presently reported. The topics covered are the formation of Ge thin films and novel application of the selective deposition of Ge to etch hole filling, characterization of the effects of thermal treatment on the evolution of the residual stress in Ge thin films, etch selectivity for etch mask and sacrificial layer applications, and gas phase release technique for stiction elimination
Keywords :
elemental semiconductors; etching; germanium; internal stresses; masks; micromachining; micromechanical devices; Ge; deposition temperature; etch hole filling; etch mask; etch selectivity; gas phase release technique; low-temperature micromachining; residual stress; sacrificial layer; selective deposition; sensor material; thermal treatment; Etching; Filling; Germanium; Micromachining; Sensor phenomena and characterization; Sensor systems and applications; Silicon; Sputtering; Temperature sensors; Thermal stresses;
fLanguage :
English
Journal_Title :
Microelectromechanical Systems, Journal of
Publisher :
ieee
ISSN :
1057-7157
Type :
jour
DOI :
10.1109/84.809050
Filename :
809050
Link To Document :
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