• DocumentCode
    1277808
  • Title

    A Portable 2-Transistor Picowatt Temperature-Compensated Voltage Reference Operating at 0.5 V

  • Author

    Seok, Mingoo ; Kim, Gyouho ; Blaauw, David ; Sylvester, Dennis

  • Author_Institution
    Dept. of Electr. Eng., Columbia Univ., New York, NY, USA
  • Volume
    47
  • Issue
    10
  • fYear
    2012
  • Firstpage
    2534
  • Lastpage
    2545
  • Abstract
    Sensing systems such as biomedical implants, infrastructure monitoring systems, and military surveillance units are constrained to consume only picowatts to nanowatts in standby and active mode, respectively. This tight power budget places ultra-low power demands on all building blocks in the systems. This work proposes a voltage reference for use in such ultra-low power systems, referred to as the 2T voltage reference, which has been demonstrated in silicon across three CMOS technologies. Prototype chips in 0.13 μm show a temperature coefficient of 16.9 ppm/°C (best) and line sensitivity of 0.033%/V, while consuming 2.22 pW in 1350 μm2. The lowest functional Vdd 0.5 V. The proposed design improves energy efficiency by 2 to 3 orders of magnitude while exhibiting better line sensitivity and temperature coefficient in less area, compared to other nanowatt voltage references. For process spread analysis, 49 dies are measured across two runs, showing the design exhibits comparable spreads in TC and output voltage to existing voltage references in the literature. Digital trimming is demonstrated, and assisted one temperature point digital trimming, guided by initial samples with two temperature point trimming, enables TC <; 50 ppm/°C and ±0.35% output precision across all 25 dies. Ease of technology portability is demonstrated with silicon measurement results in 65 nm, 0.13 μm, and 0.18 μm CMOS technologies.
  • Keywords
    CMOS integrated circuits; low-power electronics; silicon; transistors; CMOS technology; active mode; biomedical implant; energy efficiency; infrastructure monitoring system; military surveillance unit; portable 2-transistor picowatt temperature-compensated voltage reference; power 2.22 pW; process spread analysis; sensing system; silicon measurement; size 0.13 mum; size 0.18 mum; size 65 nm; standby mode; temperature point digital trimming; ultra-low power system; voltage 0.5 V; CMOS integrated circuits; Power demand; Semiconductor device measurement; Temperature measurement; Threshold voltage; Transistors; Voltage measurement; 2 transistor voltage reference; Low power; process variations; ultra low power; voltage reference;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2012.2206683
  • Filename
    6293917