DocumentCode
1277808
Title
A Portable 2-Transistor Picowatt Temperature-Compensated Voltage Reference Operating at 0.5 V
Author
Seok, Mingoo ; Kim, Gyouho ; Blaauw, David ; Sylvester, Dennis
Author_Institution
Dept. of Electr. Eng., Columbia Univ., New York, NY, USA
Volume
47
Issue
10
fYear
2012
Firstpage
2534
Lastpage
2545
Abstract
Sensing systems such as biomedical implants, infrastructure monitoring systems, and military surveillance units are constrained to consume only picowatts to nanowatts in standby and active mode, respectively. This tight power budget places ultra-low power demands on all building blocks in the systems. This work proposes a voltage reference for use in such ultra-low power systems, referred to as the 2T voltage reference, which has been demonstrated in silicon across three CMOS technologies. Prototype chips in 0.13 μm show a temperature coefficient of 16.9 ppm/°C (best) and line sensitivity of 0.033%/V, while consuming 2.22 pW in 1350 μm2. The lowest functional Vdd 0.5 V. The proposed design improves energy efficiency by 2 to 3 orders of magnitude while exhibiting better line sensitivity and temperature coefficient in less area, compared to other nanowatt voltage references. For process spread analysis, 49 dies are measured across two runs, showing the design exhibits comparable spreads in TC and output voltage to existing voltage references in the literature. Digital trimming is demonstrated, and assisted one temperature point digital trimming, guided by initial samples with two temperature point trimming, enables TC <; 50 ppm/°C and ±0.35% output precision across all 25 dies. Ease of technology portability is demonstrated with silicon measurement results in 65 nm, 0.13 μm, and 0.18 μm CMOS technologies.
Keywords
CMOS integrated circuits; low-power electronics; silicon; transistors; CMOS technology; active mode; biomedical implant; energy efficiency; infrastructure monitoring system; military surveillance unit; portable 2-transistor picowatt temperature-compensated voltage reference; power 2.22 pW; process spread analysis; sensing system; silicon measurement; size 0.13 mum; size 0.18 mum; size 65 nm; standby mode; temperature point digital trimming; ultra-low power system; voltage 0.5 V; CMOS integrated circuits; Power demand; Semiconductor device measurement; Temperature measurement; Threshold voltage; Transistors; Voltage measurement; 2 transistor voltage reference; Low power; process variations; ultra low power; voltage reference;
fLanguage
English
Journal_Title
Solid-State Circuits, IEEE Journal of
Publisher
ieee
ISSN
0018-9200
Type
jour
DOI
10.1109/JSSC.2012.2206683
Filename
6293917
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