DocumentCode
1277822
Title
A High-Reliability High-Linearity High-Power RF MEMS Metal-Contact Switch for DC–40-GHz Applications
Author
Patel, Chirag D. ; Rebeiz, Gabriel M.
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of California at San Diego, La Jolla, CA, USA
Volume
60
Issue
10
fYear
2012
Firstpage
3096
Lastpage
3112
Abstract
This paper presents an mN-level contact and restoring force RF microelectromechanical systems metal-contact switch exhibiting high reliability, high linearity, and high power handing for dc-40-GHz applications. The device, which is insensitive to stress and temperature effects, achieves 1.2-1.5 mN of contact force (per contact) from 80 to 90 V and 1.0 mN of restoring force (per contact). The up-state capacitance is 8 fF, resulting in an isolation of 46, 31, and 14 dB at 1, 6, and 40 GHz, respectively. Measured results show switch resistances of 1-2 Ω and a reliability of >; 100 million cycles at 2-5 W under cold switching at 100 mW under hot-switching conditions, in an unpackaged and standard laboratory environment. Furthermore, the device was tested under prolonged hold-down conditions and demonstrated excellent RF power handling (>;10 W) and dc current handling (>;1 A) capability.
Keywords
microswitches; microwave switches; reliability; RF microelectromechanical systems metal-contact switch; capacitance 8 fF; contact force; frequency 40 GHz; high-reliability high-linearity high-power RF MEMS metal-contact switch; hot-switching conditions; mN-level contact; power 2 W to 5 W; resistance 1 ohm to 2 ohm; standard laboratory environment; stress effects; temperature effects; unpackaged environment; up-state capacitance; voltage 80 V to 90 V; Contacts; Force; Manganese; Micromechanical devices; Radio frequency; Stress; Switches; Contact switch; RF microelectromechanical systems (MEMS); electrostatic relay; gradient insensitive; hard metal contact; high contact force; stress insensitive;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/TMTT.2012.2211888
Filename
6293922
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