Title :
Statistical region snake-based segmentation adapted to different physical noise models
Author :
Chesnaud, Christophe ; Réfrégier, Philippe ; Boulet, Wady
Author_Institution :
Domaine Univ. de Saint-Jerome, Marseille, France
fDate :
11/1/1999 12:00:00 AM
Abstract :
Algorithms for object segmentation are crucial in many image processing applications. During past years, active contour models (snakes) have been widely used for finding the contours of objects. This segmentation strategy is classically edge-based in the sense that the snake is driven to fit the maximum of an edge map of the scene. We propose a region snake approach and we determine fast algorithms for the segmentation of an object in an image. The algorithms developed in a maximum likelihood approach are based on the calculation of the statistics of the inner and the outer regions (defined by the snake). It has thus been possible to develop optimal algorithms adapted to the random fields which describe the gray levels in the input image if we assume that their probability density function family are known. We demonstrate that this approach is still efficient when no boundary´s edge exists in the image. We also show that one can obtain fast algorithms by transforming the summations over a region, for the calculation of the statistics, into summations along the boundary of the region. Finally, we will provide numerical simulation results for different physical situations in order to illustrate the efficiency of this approach
Keywords :
image segmentation; iterative methods; maximum likelihood estimation; probability; active contour models; classically edge-based strategy; maximum likelihood approach; object segmentation; physical noise models; probability density function family; random fields; statistical region snake-based segmentation; Active contours; Deformable models; Image edge detection; Image processing; Image segmentation; Layout; Maximum likelihood detection; Object segmentation; Shape; Statistics;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on