Title :
Electrical Measurement of the Thermal Impedance of Bipolar Transistors
Author :
El Rafei, Abdelkader ; Sommet, Raphaël ; Quere, Raymond
Author_Institution :
XLIM Lab., Limoges Univ., Brive-la-Gaillarde, France
Abstract :
In this letter, we present a characterization method for the determination of the thermal impedance of heterostructure bipolar transistors. The thermal impedance was characterized using low-frequency S-parameter measurements. We will show that our method can be used to characterize the thermal impedance independent of the transistor size.
Keywords :
S-parameters; bipolar transistors; electric impedance measurement; thermal variables measurement; electrical measurement; heterostructure bipolar transistors; low-frequency S-parameter measurements; thermal impedance; Bipolar transistors; Current measurement; Electric variables measurement; Frequency measurement; Gallium arsenide; HEMTs; Impedance; Impedance measurement; MODFETs; Optical feedback; Performance evaluation; Scattering parameters; Size measurement; Temperature measurement; Transistors; $S$ -parameters; Bipolar transistors; thermal feedback; thermal impedance;
Journal_Title :
Electron Device Letters, IEEE
DOI :
10.1109/LED.2010.2052232
