Title :
Burst-mode bit-error-rate characterization of dual-rate MIL-STD-1773 transceiver
Author :
Kim, Jae H. ; Bonebright, Rodney K. ; Harrang, Jeffrey P. ; Bocek, Thomas ; Chan, Eric Y. ; Hong, Chi-Shain
Author_Institution :
Res. & Technol. Center, Boeing Defense & Space Group, Seattle, WA, USA
Abstract :
A radiation-hardened "dual-rate MIL-STD-1773" transceiver was first developed for military command/response time-division-multiplexed data bus applications. The transceiver operates at dual rates of 1 and 20 Mb/s over temperature (-25 to +85 C). With Manchester-II burst messages, the dual-rate transceiver showed a large dynamic range of greater than 20 dB in support of 32-node star network; a sensitivity of -38.7 dBm and a saturation of -16.1 dBm (limited mainly by an LED test source power) at BER/spl les/1/spl times/10/sup -10/. These transceivers are currently used for space and military applications such as DARPA, NASA and JPL programs.
Keywords :
codes; command and control systems; data communication; light emitting diodes; military communication; military systems; optical saturation; radiation hardening; sensitivity; time division multiplexing; transceivers; -25 to 85 C; 1 to 20 Mbit/s; 32-node star network; DARPA; JPL programs; LED test source power; Manchester codes; Manchester-II burst messages; NASA; burst-mode bit-error-rate characterization; dual rates; dual-rate MIL-STD-1773 transceiver; large dynamic range; military applications; military command; military response time-division-multiplexed data bus applications; radiation-hardened; saturation; sensitivity; space applications; Clocks; Coupling circuits; Delay; Optical amplifiers; Optical receivers; Optical transmitters; Passive optical networks; Single event upset; Switches; Transceivers;
Journal_Title :
Photonics Technology Letters, IEEE
