Title :
An empirical study of software reuse with special attention to Ada
Author :
Lee, Nam-Yong ; Litecky, Charles R.
Author_Institution :
Inf. Syst. Directorate, Korea Inst. for Defense Inf. Syst., Seoul, South Korea
fDate :
9/1/1997 12:00:00 AM
Abstract :
Over the past several decades, numerous software technologies have been developed for overcoming the software crisis. Among these technologies, reuse has been recognized as one of the most important software technologies. Recently, it has gained substantial attention as a possible solution to the software crisis in Ada and other software communities. The purpose of this empirical study is to examine how organizations actually exploit reuse technologies and evaluates how reuse factors affect the rate of reuse in an organization. This study is an attempt to enhance the measurement of the rate of reuse and the effectiveness of reuse by establishing conceptual foundations in the literature for reuse and conducting an empirical investigation of organizations using Ada technology. This study differentiated software reuse into six criteria: domain, human, tool, organization, software metrics, and environment. The results of this study show that the rate of reuse significantly depends upon reuse capability, software development effort, object-oriented design capability, repository development effort, Ada technology capability, and domain capability
Keywords :
Ada; object-oriented languages; object-oriented programming; software metrics; software reusability; software tools; Ada; domain capability; factor analysis; human factors; literature; measurement; multiple regression analysis; object-oriented design; organizations; repository development; software crisis; software development effort; software environment; software metrics; software reuse; software tool; Computer industry; Government; Humans; Programming; Regression analysis; Software engineering; Software metrics; Software standards; Software tools; Standards development;
Journal_Title :
Software Engineering, IEEE Transactions on