DocumentCode :
1279873
Title :
CATE - a software toolset for VLSI test generation
Author :
Dettmer, Roger
Volume :
33
Issue :
5
fYear :
1987
fDate :
5/1/1987 12:00:00 AM
Firstpage :
307
Lastpage :
311
Abstract :
As integration levels have increased, integrated circuits have become harder to test. The CATE software toolset is aimed at supporting the IC designer in developing flexible test strategies for VLSI
fLanguage :
English
Journal_Title :
Electronics and Power
Publisher :
iet
ISSN :
0013-5127
Type :
jour
DOI :
10.1049/ep.1987.0203
Filename :
5187424
Link To Document :
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