CATE - a software toolset for VLSI test generation
Author :
Dettmer, Roger
Volume :
33
Issue :
5
fYear :
1987
fDate :
5/1/1987 12:00:00 AM
Firstpage :
307
Lastpage :
311
Abstract :
As integration levels have increased, integrated circuits have become harder to test. The CATE software toolset is aimed at supporting the IC designer in developing flexible test strategies for VLSI