Title :
Reliability and degradation of small molecule-based organic light-emitting devices (OLEDs)
Author :
Popovic, Zoran D. ; Aziz, Hany
Author_Institution :
Xerox Res. Centre of Canada, Mississauga, Ont., Canada
Abstract :
Studies of degradation mechanisms in small molecule-based organic light-emitting devices (OLEDs) are reviewed. A special emphasis is given to OLEDs based on tris (8-hydroxyquinoline) aluminum (AlQ3), an emitter and electron transport material used in the majority of OLEDs emitting from the green to the red part of the spectrum. Different strategies used for increasing device stability are addressed and the models proposed to explain experimental observations related to OLED operational stability are discussed. Although none of the presently proposed models can explain all experimental observations, the largest body of experimental evidence appears to be consistent with a model based on the instability of cationic AlQ3 species, produced by the injection of holes into the AlQ3 electron transport and emitter layer. Other models may be of importance in explaining degradation behavior on different time scales. Models based on redistribution of space charge appear to be responsible for reversible short-term degradation, while a model based on indium migration may be important for degradation on very long time scales
Keywords :
light emitting diodes; organic compounds; reliability; stability; AlQ3; OLED; OLED operational stability; degradation behavior; degradation mechanisms; electron emitter layer; electron transport; electron transport material; green spectrum; indium migration; instability; long time scales; models; red spectrum; reliability; short-term degradation; small molecule-based organic light-emitting devices; time scales; tris (8-hydroxyquinoline) aluminum; Aluminum; Charge carrier processes; Conducting materials; Electroluminescence; Electron emission; Organic light emitting diodes; Organic materials; Polymer films; Stability; Thermal degradation;
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
DOI :
10.1109/2944.999191