DocumentCode :
1280519
Title :
Accurate quantification of the Purcell effect in the presence of a dielectric microdisk of nanoscale thickness
Author :
Balaban, Mikhail V. ; Sauleau, Ronan ; Benson, T.M. ; Nosich, Alexander I.
Author_Institution :
Inst. of Radio-Phys. & Electron., NASU, Kharkiv, Ukraine
Volume :
6
Issue :
6
fYear :
2011
fDate :
6/1/2011 12:00:00 AM
Firstpage :
393
Lastpage :
396
Abstract :
The spontaneous emission of a molecular dipole in the presence of a thin dielectric microdisk is studied as a 3D solution of Maxwell´s equations with two-sided generalised boundary conditions on the disk median plane, local energy finiteness and a radiation condition at infinity. Results presented show that the radiative and non-radiative decay rates display resonance maxima associated with the disk natural frequencies which can be explained through the effective-refractive-index approximation. The numerical solution is based on a set of coupled integral equations of the Fredholm second kind, with smooth kernel functions, obtained with the aid of the method of analytical regularisation.
Keywords :
Fredholm integral equations; Maxwell equations; dielectric resonance; discs (structures); refractive index; spontaneous emission; 3D solution; Maxwell equations; Purcell effect; analytical regularisation; coupled Fredholm second kind integral equations; effective-refractive-index approximation; kernel functions; molecular dipole; nonradiative decay rates; numerical solution; resonance maxima; spontaneous emission; thin dielectric microdisk; two-sided generalised boundary conditions;
fLanguage :
English
Journal_Title :
Micro & Nano Letters, IET
Publisher :
iet
ISSN :
1750-0443
Type :
jour
DOI :
10.1049/mnl.2011.0176
Filename :
5960456
Link To Document :
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