DocumentCode
1280573
Title
Comparison of the curvature homogeneity and dynamic behaviour of framed and frameless electrostatic X/Y scanning micromirrors
Author
Bauer, Ralf ; Brown, G. ; Uttamchandani, Deepak
Author_Institution
Dept. of Electron. & Electr. Eng., Univ. of Strathclyde, Glasgow, UK
Volume
6
Issue
6
fYear
2011
fDate
6/1/2011 12:00:00 AM
Firstpage
425
Lastpage
428
Abstract
Experimental investigations on the influence of a frame structure around an electrostatic comb-drive actuated micromirror are presented. The comparison between two 800 m diameter mirrors, one framed and the other frameless, fabricated with a multi-user silicon-on-insulator process was carried out in relation to the dynamic movement behaviour and the static and dynamic curvature of the mirror surfaces. Both mirror types used in the study were carefully chosen to have a similar diameter and torsional resonant frequency of the order of 7 kHz and are actuated with 10 pairs of comb-fingers. The inclusion of the frame structure is shown to increase the homogeneity of the curvature of the mirror, with a difference of radius of curvature between the main axes of 1 compared to a 10 difference for the frameless mirror. The frame also increases the achievable maximum resonant tilt angle around the second main axis by a factor of three, at the same time avoiding nonlinear frequency responses (such as hysteresis) in the tilt angle against frequency curve.
Keywords
curvature measurement; micromirrors; nonlinear optics; silicon-on-insulator; comb-fingers; curvature homogeneity; curvature radius; diameter mirror; dynamic curvature; dynamic movement behaviour; electrostatic comb-drive actuated micromirror; frame structure; framed electrostatic X/Y scanning micromirror; frameless electrostatic X/Y scanning micromirror; frameless mirror; frequency curve; maximum resonant tilt angle; mirror surface; multiuser silicon-on-insulator process; tilt angle; time avoiding nonlinear frequency response; torsional resonant frequency;
fLanguage
English
Journal_Title
Micro & Nano Letters, IET
Publisher
iet
ISSN
1750-0443
Type
jour
DOI
10.1049/mnl.2011.0113
Filename
5960464
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