• DocumentCode
    1280573
  • Title

    Comparison of the curvature homogeneity and dynamic behaviour of framed and frameless electrostatic X/Y scanning micromirrors

  • Author

    Bauer, Ralf ; Brown, G. ; Uttamchandani, Deepak

  • Author_Institution
    Dept. of Electron. & Electr. Eng., Univ. of Strathclyde, Glasgow, UK
  • Volume
    6
  • Issue
    6
  • fYear
    2011
  • fDate
    6/1/2011 12:00:00 AM
  • Firstpage
    425
  • Lastpage
    428
  • Abstract
    Experimental investigations on the influence of a frame structure around an electrostatic comb-drive actuated micromirror are presented. The comparison between two 800 m diameter mirrors, one framed and the other frameless, fabricated with a multi-user silicon-on-insulator process was carried out in relation to the dynamic movement behaviour and the static and dynamic curvature of the mirror surfaces. Both mirror types used in the study were carefully chosen to have a similar diameter and torsional resonant frequency of the order of 7 kHz and are actuated with 10 pairs of comb-fingers. The inclusion of the frame structure is shown to increase the homogeneity of the curvature of the mirror, with a difference of radius of curvature between the main axes of 1 compared to a 10 difference for the frameless mirror. The frame also increases the achievable maximum resonant tilt angle around the second main axis by a factor of three, at the same time avoiding nonlinear frequency responses (such as hysteresis) in the tilt angle against frequency curve.
  • Keywords
    curvature measurement; micromirrors; nonlinear optics; silicon-on-insulator; comb-fingers; curvature homogeneity; curvature radius; diameter mirror; dynamic curvature; dynamic movement behaviour; electrostatic comb-drive actuated micromirror; frame structure; framed electrostatic X/Y scanning micromirror; frameless electrostatic X/Y scanning micromirror; frameless mirror; frequency curve; maximum resonant tilt angle; mirror surface; multiuser silicon-on-insulator process; tilt angle; time avoiding nonlinear frequency response; torsional resonant frequency;
  • fLanguage
    English
  • Journal_Title
    Micro & Nano Letters, IET
  • Publisher
    iet
  • ISSN
    1750-0443
  • Type

    jour

  • DOI
    10.1049/mnl.2011.0113
  • Filename
    5960464