DocumentCode :
1280699
Title :
Low-frequency reflectivity approximation for two- and three-dimensional EM absorbers
Author :
Baekelandt, Bart ; Olyslager, Frank ; De Zutter, Daniel
Author_Institution :
Dept. of Inf. Technol., Ghent Univ., Belgium
Volume :
41
Issue :
4
fYear :
1999
fDate :
11/1/1999 12:00:00 AM
Firstpage :
354
Lastpage :
360
Abstract :
Large-size electromagnetic absorbers are mainly used in anechoic and semi-anechoic chambers for electromagnetic compatibility testing. Therefore, the determination of the reflectivities in the low-frequency range (30-300 MHz) are of paramount importance in the performance evaluation of the absorber and, finally, in a “dark room” design. We here present a low-frequency approximation of the reflectivity based on a boundary and surface integral equation technique. This approach makes it possible to compare the approximation to the rigorous integral equation approach and to other approximations in the literature. The validity of the new low-frequency approximation is discussed based on reflectivity calculations of representative two- (2-D) and three-dimensional (3-D) absorber structures
Keywords :
UHF radio propagation; anechoic chambers (electromagnetic); approximation theory; boundary integral equations; electromagnetic compatibility; electromagnetic wave absorption; electromagnetic wave reflection; reflectivity; 30 to 300 MHz; LF; VHF; anechoic chamber; boundary integral equation; dark room design; electromagnetic compatibility testing; large-size EM absorbers; low-frequency reflectivity approximation; semi-anechoic chamber; surface integral equation; three-dimensional EM absorbers; two-dimensional EM absorbers; Conductivity; Electromagnetic compatibility; Finite difference methods; Information technology; Integral equations; Kernel; Permittivity; Reflectivity; Testing; Time domain analysis;
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9375
Type :
jour
DOI :
10.1109/15.809815
Filename :
809815
Link To Document :
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