• DocumentCode
    1280854
  • Title

    Reducing EMC problems through an electrical/optical interconnection technology

  • Author

    Griese, Elmar

  • Author_Institution
    C-LAB, Siemens AG, Paderborn, Germany
  • Volume
    41
  • Issue
    4
  • fYear
    1999
  • fDate
    11/1/1999 12:00:00 AM
  • Firstpage
    502
  • Lastpage
    509
  • Abstract
    A novel interconnection technology for printed circuit boards (PCBs) is proposed that has the potential to meet the high-performance requirements of future electronic equipment while at the same time, the electromagnetic compatibility (EMC) behavior will be improved significantly. The technology has a far-reaching compatibility with the existing printed circuit-board technology and the existing design and manufacturing processes of the electrical part do not need significant modifications. After a short description of the most important basic technologies for its realization, this paper focuses on a general approach for modeling the resulting hybrid electrical/optical interconnections containing integrated optical highly multimodal waveguides with manufacturing-caused rough surfaces. Especially the transient analysis is addressed in order to provide an efficient analysis methodology and algorithms for timing and signal integrity prediction necessary for designing and manufacturing high-speed electronic systems. The developed overall modeling strategy is explained and first available results are presented
  • Keywords
    electro-optical devices; electromagnetic compatibility; interconnections; printed circuits; EMC problems reduction; PCBs; electrical/optical interconnection technology; electromagnetic compatibility; high-speed electronic systems; printed circuit boards; transient analysis; Algorithm design and analysis; Electromagnetic compatibility; Electronic equipment; Integrated circuit interconnections; Integrated circuit technology; Manufacturing processes; Optical interconnections; Optical waveguides; Printed circuits; Process design;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/15.809854
  • Filename
    809854