Title :
Two control and observation structures for analogue circuits
Author :
Lee, Kuen-Jong ; Wen, Yun-Che
Author_Institution :
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
fDate :
9/11/1997 12:00:00 AM
Abstract :
Two novel analogue control and observation structures which can be used to increase the testability of analogue circuits are presented. Both structures can be easily incorporated into the IEEE P 1149.4 environment to execute both DC and AC testing. The first structure consists of five switches and can perform concurrent testing. The second contains only four switches but is mainly used for off-line testing
Keywords :
analogue integrated circuits; automatic testing; design for testability; integrated circuit testing; AC testing; DC testing; IEEE P 1149.4 environment; analogue circuits; concurrent testing; off-line testing; switches; testability;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19971112
