DocumentCode :
128088
Title :
Use of reference limits in the Feature Selective Validation (FSV) method
Author :
Jauregui, Ricardo ; Pous, Marc ; Silva, Francisco
Author_Institution :
Dept. d´Eng. Electron. (DEE), Univ. Politec. de Catalunya - BarcelonaTech (UPC), Barcelona, Spain
fYear :
2014
fDate :
1-4 Sept. 2014
Firstpage :
1031
Lastpage :
1036
Abstract :
This paper presents a method for taking into account reference limits when the Feature Selective method (FSV) is applied. Nowadays, there is a long line of research that underlines the important role played by the FSV to perform an objective validation process. However, until now, there has been no consideration of a reference level in the validation process. This paper presents a methodology to calculate the FSV values when a reference limit is contemplated. We demonstrate the importance of this technique in the validation criteria for the Computational Electromagnetics and, more particularly, in the EMC comparison process. Finally, in order to show the application and the importance of the method, two real cases, considering different reference levels, are analysed.
Keywords :
computational electromagnetics; electromagnetic compatibility; EMC comparison process; FSV method; computational electromagnetics; electromagnetic compatibility; feature selective validation method; reference levels; reference limits; validation criteria; validation process; Antenna measurements; Computational electromagnetics; Electromagnetic compatibility; Europe; Frequency measurement; Frequency modulation; Standards; Computational Electromagnetics (CEM); Computer simulation; Data comparison; Feature Selective Validation method (FSV); Numerical simulation; Validation; reference limits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility (EMC Europe), 2014 International Symposium on
Conference_Location :
Gothenburg
Type :
conf
DOI :
10.1109/EMCEurope.2014.6931054
Filename :
6931054
Link To Document :
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