DocumentCode
1281092
Title
Measurement of crosstalk-induced delay errors in integrated circuits
Author
Moll, F. ; Roca, M. ; Rubio, A.
Author_Institution
Dept. of Electron. Eng., Univ. Politecnica de Catalunya, Barcelona, Spain
Volume
33
Issue
19
fYear
1997
fDate
9/11/1997 12:00:00 AM
Firstpage
1623
Lastpage
1624
Abstract
Coupling between lines may cause a variation in the effective transition delay in a digital signal path if there exists a simultaneous transition in the coupled lines. The authors present a measurement method for this effect, using a specifically designed integrated circuit. It is shown that the effect may produce either an increase or a decrease in the critical path, therefore altering the maximum frequency specification of a synchronous sequential circuit
Keywords
VLSI; crosstalk; delays; integrated circuit measurement; logic testing; sequential circuits; IC measurement; VLSI; coupled lines; critical path; crosstalk-induced delay errors; digital signal path; effective transition delay; maximum frequency specification; synchronous sequential circuit;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19971083
Filename
629595
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