• DocumentCode
    1281221
  • Title

    Waveguide Zeeman interferometry for thin-film chemical sensors

  • Author

    Grace, K.M. ; Shrouf, K. ; Honkanen, S. ; Ayras, P. ; Katila, P. ; Leppihalme, M. ; Johnston, R.G. ; Yang, X. ; Swanson, B. ; Peyghambarian, N.

  • Author_Institution
    Los Alamos Nat. Lab., NM, USA
  • Volume
    33
  • Issue
    19
  • fYear
    1997
  • fDate
    9/11/1997 12:00:00 AM
  • Firstpage
    1651
  • Lastpage
    1653
  • Abstract
    The authors demonstrate a highly sensitive chemical sensor scheme based on Si3N4 channel waveguides, species-selective surface coatings and Zeeman interferometry. The relative phase change between the TE and TM modes under exposure to toluene vapour is measured. The measurements demonstrate the real-time and reversible response with good sensitivity at low concentrations
  • Keywords
    chemical sensors; integrated optics; light interferometry; optical waveguides; silicon compounds; Si3N4; Si3N4 channel waveguides; TE modes; TM modes; highly sensitive sensor scheme; species-selective surface coatings; thin-film chemical sensors; toluene vapour; waveguide Zeeman interferometry;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19971108
  • Filename
    629615
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1281221