• DocumentCode
    1281245
  • Title

    Observation of spectral hole burning in photocurrent spectrum of InAs self-assembled quantum dots embedded in PIN diode

  • Author

    Sugiyama, Y. ; Nakata, Y. ; Muto, S. ; Horiguchi, N. ; Futatsugi, T. ; Awano, Y. ; Yokoyama, N.

  • Author_Institution
    Fujitsu Labs. Ltd., Atsugi, Japan
  • Volume
    33
  • Issue
    19
  • fYear
    1997
  • fDate
    9/11/1997 12:00:00 AM
  • Firstpage
    1655
  • Lastpage
    1657
  • Abstract
    The spectral hole burning of InAs self-assembled quantum dots (QDs) embedded in a PIN diode has been observed for the first time. The spectral hole depth increases as the electric field is increased. By numerical fitting to experimental results, the possibility of wavelength-domain multiplicity in optical memory by using InAs QDs is shown
  • Keywords
    III-V semiconductors; indium compounds; optical hole burning; optical storage; p-i-n photodiodes; photoconductivity; semiconductor quantum dots; InAs; InAs self-assembled quantum dots; PIN diode; electric field; optical memory; photocurrent spectrum; spectral hole burning; spectral hole depth; wavelength-domain multiplicity;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19971096
  • Filename
    629618