• DocumentCode
    1281251
  • Title

    Accurate equivalent-network modelling of GaAs/AlAs based resonant tunnelling diodes with thin barrier layers

  • Author

    Kwaspen, J.J.M. ; Lepsa, M.I. ; van de Roer, Th G ; van der Vleuten, W.

  • Author_Institution
    Fac. of Electr. Eng., Eindhoven Univ. of Technol., Netherlands
  • Volume
    33
  • Issue
    19
  • fYear
    1997
  • fDate
    9/11/1997 12:00:00 AM
  • Firstpage
    1657
  • Lastpage
    1658
  • Abstract
    The small-signal intrinsic impedance of GaAs/AlAs based resonant tunnelling diodes with thin barriers has been measured at room temperature over the full 0-2 V bias-voltage and 0.05-40.05 GHz frequency ranges, on stable, non-oscillating devices. The classical Esaki and the quantum-inductance equivalent circuits were used to model the impedance for CAD purposes. Information about the quasibound-state lifetime against bias-voltage was extracted
  • Keywords
    III-V semiconductors; aluminium compounds; electric impedance; equivalent circuits; gallium arsenide; millimetre wave diodes; resonant tunnelling diodes; semiconductor device models; 0 to 2 V; 0.05 to 40.05 GHz; CAD; Esaki equivalent circuits; GaAs-AlAs; GaAs/AlAs based RTD; bias-voltage; equivalent-network modelling; impedance modelling; quantum-inductance equivalent circuits; quasibound-state lifetime; resonant tunnelling diodes; thin barriers;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19971107
  • Filename
    629619