Title :
Lamb wave contrast in non-contacting surface acoustic wave microscopy
Author :
Somekh, M.G. ; Sharples, S.D. ; Clark, M. ; See, C.W.
Author_Institution :
Dept. of Electr. & Electron. Eng., Nottingham Univ., UK
fDate :
10/14/1999 12:00:00 AM
Abstract :
Subsurface imaging in a non-contacting surface acoustic wave microscope is demonstrated, using mode conversion from Rayleigh to Lamb modes. The fact that, unlike in a conventional acoustic microscope, the technique does not require fluid couplants allows new contrast mechanisms to be used for the quantification of defects
Keywords :
Rayleigh waves; acoustic microscopy; flaw detection; surface acoustic waves; ultrasonic imaging; ultrasonic materials testing; Lamb wave contrast; Rayleigh modes; contrast mechanisms; defect quantification; mode conversion; noncontacting SAW microscopy; subsurface imaging; surface acoustic wave microscopy;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19991257
