DocumentCode
1281547
Title
Accelerated life testing of a traction inverter
Author
Oates, Colin
Author_Institution
ALSTOM Res. & Technol. Centre, Stafford, UK
Volume
13
Issue
5
fYear
1999
Firstpage
263
Lastpage
271
Abstract
The introduction of new technology into equipment brings with it the risk of long-term reliability problems. Manufacturers need to review methods of type testing to reflect the changing properties of inverter technology. The introduction of a traction drive using insulated gate bipolar transistor semiconductor switches to trains for the Northern Line of London Underground represented such a change in technology. The failure of IGBTs under conditions of deep thermal cycling is well documented and it was uncertain as to whether the stresses of station-to-station running would give rise to such a problem, so a life test was devised.
Keywords
invertors; accelerated life testing; deep thermal cycling; failure testing; insulated gate bipolar transistor semiconductor switches; long-term reliability; power IGBTs; traction drive; traction inverter;
fLanguage
English
Journal_Title
Power Engineering Journal
Publisher
iet
ISSN
0950-3366
Type
jour
DOI
10.1049/pe:19990511
Filename
810607
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