DocumentCode :
1281547
Title :
Accelerated life testing of a traction inverter
Author :
Oates, Colin
Author_Institution :
ALSTOM Res. & Technol. Centre, Stafford, UK
Volume :
13
Issue :
5
fYear :
1999
Firstpage :
263
Lastpage :
271
Abstract :
The introduction of new technology into equipment brings with it the risk of long-term reliability problems. Manufacturers need to review methods of type testing to reflect the changing properties of inverter technology. The introduction of a traction drive using insulated gate bipolar transistor semiconductor switches to trains for the Northern Line of London Underground represented such a change in technology. The failure of IGBTs under conditions of deep thermal cycling is well documented and it was uncertain as to whether the stresses of station-to-station running would give rise to such a problem, so a life test was devised.
Keywords :
invertors; accelerated life testing; deep thermal cycling; failure testing; insulated gate bipolar transistor semiconductor switches; long-term reliability; power IGBTs; traction drive; traction inverter;
fLanguage :
English
Journal_Title :
Power Engineering Journal
Publisher :
iet
ISSN :
0950-3366
Type :
jour
DOI :
10.1049/pe:19990511
Filename :
810607
Link To Document :
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