• DocumentCode
    1281547
  • Title

    Accelerated life testing of a traction inverter

  • Author

    Oates, Colin

  • Author_Institution
    ALSTOM Res. & Technol. Centre, Stafford, UK
  • Volume
    13
  • Issue
    5
  • fYear
    1999
  • Firstpage
    263
  • Lastpage
    271
  • Abstract
    The introduction of new technology into equipment brings with it the risk of long-term reliability problems. Manufacturers need to review methods of type testing to reflect the changing properties of inverter technology. The introduction of a traction drive using insulated gate bipolar transistor semiconductor switches to trains for the Northern Line of London Underground represented such a change in technology. The failure of IGBTs under conditions of deep thermal cycling is well documented and it was uncertain as to whether the stresses of station-to-station running would give rise to such a problem, so a life test was devised.
  • Keywords
    invertors; accelerated life testing; deep thermal cycling; failure testing; insulated gate bipolar transistor semiconductor switches; long-term reliability; power IGBTs; traction drive; traction inverter;
  • fLanguage
    English
  • Journal_Title
    Power Engineering Journal
  • Publisher
    iet
  • ISSN
    0950-3366
  • Type

    jour

  • DOI
    10.1049/pe:19990511
  • Filename
    810607