• DocumentCode
    1281795
  • Title

    A Self-Rectifying \\hbox {AlO}_{y} Bipolar RRAM With Sub-50- \\mu\\hbox {A} Set/Reset Curren

  • Author

    Tran, X.A. ; Zhu, W. ; Liu, W.J. ; Yeo, Y.C. ; Nguyen, B.Y. ; Yu, Hong Yu

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ., Singapore, Singapore
  • Volume
    33
  • Issue
    10
  • fYear
    2012
  • Firstpage
    1402
  • Lastpage
    1404
  • Abstract
    In this letter, a bipolar resistive switching RAM based on Ni/AlOy/n+-Si which exhibits high potential to realize transistor-free operation for cross-bar array is successfully demonstrated. The proposed device shows well-behaved bipolar memory performance with self-rectifying behavior in low-resistance state (>; 700 at 0.2 V), a high on/off resistance ratio (>;103), a good retention characteristic (>; 104 s at 100 °C ), and a wide readout margin for cross-bar architecture (number of word line N >; 25 for worst case condition).
  • Keywords
    aluminium compounds; elemental semiconductors; nickel; random-access storage; silicon; Ni-AlO-Si; bipolar resistive switching random access memory; cross-bar architecture; cross-bar array; current 50 muA; high on-off resistance ratio; readout margin; retention characteristic; self-rectifying bipolar RRAM; subset-reset current; temperature 100 degC; transistor-free operation; voltage 0.2 V; worst case condition; Arrays; Electron devices; Nickel; Resistance; Silicon; Switches; Bipolar; resistive random access memory (RRAM); resistive switching (RS); self-rectifying;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2012.2210855
  • Filename
    6296683