• DocumentCode
    128205
  • Title

    Failure prediction and health prognostics of electronic components: A review

  • Author

    Bhargava, Chitresh ; Banga, Vijay Kumar ; Singh, Yogang

  • Author_Institution
    Lovely Prof. Univ., Phagwara, India
  • fYear
    2014
  • fDate
    6-8 March 2014
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    The Rapid evolution of electronics device technology towards low cost and high performance, the electronics products become more complex, higher in density and speed, and lighter for easy portability. In modern competitive market, low cost and high performance are the key factors to attract the customers towards their products. Growing system complexity demands robust control to mitigate system control and disturbances. As more and more components are integrated on to a single chip, the probability of damage is increased, as the different components have different characteristics and different operating conditions. So a condition monitoring techniques are employed which embraces a knowledge of failure mechanism of individual part or integrated system, and diagnosis the health condition of a system in real time such that if it drifts from scheduled outcomes, an appropriate action to be taken before serious deterioration or breakdown occurs. The electronic system needs a fault prediction methodology to prevent the system from accidental failure and discrepancies. In this paper, different failure prediction methods have been discussed. For an efficient working of system, it is the prime requirement to analyze reliability prediction of electronic components along with life cycle costs.
  • Keywords
    condition monitoring; electronic products; failure analysis; probability; accidental failure; condition monitoring techniques; electronic system; electronics device technology; electronics products; failure mechanism; failure prediction and health prognostics; fault prediction methodology; life cycle costs; probability of damage; reliability prediction analysis; robust control; system complexity demands; system control mitigation; Condition monitoring; Consumer electronics; Electronic components; Physics; Predictive models; Reliability; Artificial Intelligence; Condition Monitoring; Failure Prediction; Physics of Failure (PoF); Reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering and Computational Sciences (RAECS), 2014 Recent Advances in
  • Conference_Location
    Chandigarh
  • Print_ISBN
    978-1-4799-2290-1
  • Type

    conf

  • DOI
    10.1109/RAECS.2014.6799572
  • Filename
    6799572