• DocumentCode
    1282094
  • Title

    Stress-based and path-based fault injection

  • Author

    Tsai, Timothy K. ; Hsueh, Mei-Chen ; Zhao, Hong ; Kalbarczyk, Zbigniew ; Iyer, Ravishankar K.

  • Author_Institution
    AT&T Bell Labs., Murray Hill, NJ, USA
  • Volume
    48
  • Issue
    11
  • fYear
    1999
  • fDate
    11/1/1999 12:00:00 AM
  • Firstpage
    1183
  • Lastpage
    1201
  • Abstract
    The objective of fault injection is to mimic the existence of faults and to force the exercise of the fault tolerance mechanisms of the target system. To maximize the efficacy of each injection, the locations, timing, and conditions for faults being injected must be carefully chosen. Faults should be injected with a high probability of being accessed. This paper presents two fault injection methodologies-stress-based injection and path-based injection; both are based on resource activity analysis to ensure that injections cause fault tolerance activity and, thus, the resulting exercise of fault tolerance mechanisms. The difference between these two methods is that stress-based injection validates the system dependability by monitoring the run-time workload activity at the system level to select faults that coincide with the locations and times of greatest workload activity, while path-based injection validates the system from the application perspective by using an analysis of the program flow and resource usage at the application program level to select faults during the program execution. These two injection methodologies focus separately on the system and process viewpoints to facilitate the testing of system dependability. Details of these two injection methodologies are discussed in this paper, along with their implementations, experimental results, and advantages and disadvantages
  • Keywords
    fault tolerant computing; resource allocation; fault injection; fault injection methodologies; fault tolerance; resource activity analysis; run-time workload activity; system dependability; Computer vision; Fault detection; Fault tolerance; Fault tolerant systems; Hardware; Monitoring; Runtime; Stress; System testing; Timing;
  • fLanguage
    English
  • Journal_Title
    Computers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9340
  • Type

    jour

  • DOI
    10.1109/12.811108
  • Filename
    811108