DocumentCode :
1282527
Title :
Analysis of sensitivity of microwave surface resistance measurement of HTS thin films using dielectric resonator with finite shield
Author :
Misra, Mukul ; Kataria, N.D. ; Srivastava, G.P.
Author_Institution :
Supercond Div., Nat. Phys. Lab., New Delhi, India
Volume :
35
Issue :
20
fYear :
1999
fDate :
9/30/1999 12:00:00 AM
Firstpage :
1779
Lastpage :
1780
Abstract :
The exact expressions for geometrical factors of various parts of a TE011 mode dielectric resonator with finite shield have been obtained by defining the Q-factor. The effect of the shield diameter on the sensitivity of the surface resistance (Rs) measurement of HTS thin films is investigated
Keywords :
Q-factor; dielectric resonators; electric resistance measurement; electromagnetic shielding; high-temperature superconductors; microwave measurement; superconducting thin films; surface conductivity; HTS thin film; Q-factor; geometrical factor; microwave surface resistance measurement; sensitivity; shielded dielectric resonator;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el:19991174
Filename :
811183
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1282527
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