• DocumentCode
    1282527
  • Title

    Analysis of sensitivity of microwave surface resistance measurement of HTS thin films using dielectric resonator with finite shield

  • Author

    Misra, Mukul ; Kataria, N.D. ; Srivastava, G.P.

  • Author_Institution
    Supercond Div., Nat. Phys. Lab., New Delhi, India
  • Volume
    35
  • Issue
    20
  • fYear
    1999
  • fDate
    9/30/1999 12:00:00 AM
  • Firstpage
    1779
  • Lastpage
    1780
  • Abstract
    The exact expressions for geometrical factors of various parts of a TE011 mode dielectric resonator with finite shield have been obtained by defining the Q-factor. The effect of the shield diameter on the sensitivity of the surface resistance (Rs) measurement of HTS thin films is investigated
  • Keywords
    Q-factor; dielectric resonators; electric resistance measurement; electromagnetic shielding; high-temperature superconductors; microwave measurement; superconducting thin films; surface conductivity; HTS thin film; Q-factor; geometrical factor; microwave surface resistance measurement; sensitivity; shielded dielectric resonator;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19991174
  • Filename
    811183
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1282527