Title :
Using Reed-Muller coefficients to synthesise optimal prediction modules for concurrent testing
Author :
Ortega, Julio ; Lloris, A. ; Prieto, A. ; Pelayo, F.J.
Author_Institution :
Dept. de Electron. y Tecnologia de Computadores, Granada Univ., Spain
fDate :
7/4/1991 12:00:00 AM
Abstract :
Shows that the synthesis of the extra circuitry required for testing a digital circuit during its normal operation is a problem of selecting an optimal set of Reed-Muller spectral coefficients. To obtain acceptable solutions for this NP-complete problem, an algorithm based on simulated annealing is proposed.
Keywords :
built-in self test; digital integrated circuits; integrated circuit testing; NP-complete problem; Reed-Muller coefficients; concurrent self testing circuits; concurrent testing; digital circuit testing; extra circuitry; optimal prediction modules synthesis; simulated annealing;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19910779
