• DocumentCode
    1283200
  • Title

    Velocity saturation in the collector of Si/Ge/sub x/Si/sub 1-x//Si HBT´s

  • Author

    Cottrell, Peter E. ; Yu, Zhiping

  • Author_Institution
    Center for Integrated Syst., Stanford Univ., CA, USA
  • Volume
    11
  • Issue
    10
  • fYear
    1990
  • Firstpage
    431
  • Lastpage
    433
  • Abstract
    The effects of velocity saturation on the unity gain-bandwidth product f/sub t/ and transconductance g/sub m/ of n-p-n and p-n-p heterojunction bipolar transistors (HBTs) with Ge/sub x/Si/sub 1-x/ bases are described and simulated. For the n-p-n device, velocity saturation combined with a valence-band offset at the base-collector junction causes accelerated g/sub m/ and f/sub t/ rolloff for current densities greater than the knee current for the Kirk effect. For the p-n-p device, the g/sub m/ and f/sub t/ are degraded for all current densities. These limitations combine with the limits imposed by dislocation formation due to strain in the pseudomorphic layer to impose constraints on the design of Si/Ge/sub x/Si/sub 1-x//Si HBTs.<>
  • Keywords
    Ge-Si alloys; elemental semiconductors; heterojunction bipolar transistors; silicon; Kirk effect; Si-Ge/sub x/Si/sub 1-x/-Si; base-collector junction; current density rolloff; dislocation formation; knee current; npn HBTs; p-n-p heterojunction bipolar transistors; pseudomorphic layer; transconductance; unity gain-bandwidth product; valence-band offset; velocity saturation; Bipolar transistors; Current density; Doping; Electrons; Heterojunction bipolar transistors; Knee; P-n junctions; Photonic band gap; Space charge; Transconductance;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/55.62986
  • Filename
    62986