DocumentCode
1283526
Title
Software support for PAL testing
Author
Mannan, Maqsoodul
Author_Institution
National Semiconductor Corp., Santa Clara, USA
Volume
32
Issue
2
fYear
1986
fDate
2/1/1986 12:00:00 AM
Firstpage
145
Lastpage
148
Abstract
User-programmable logic devices can rightly be called the ultimate in semicustom integrated circuits. But their very `one-off¿ nature makes their testing and exacting task
fLanguage
English
Journal_Title
Electronics and Power
Publisher
iet
ISSN
0013-5127
Type
jour
DOI
10.1049/ep.1986.0086
Filename
5188228
Link To Document