DocumentCode :
1283534
Title :
V_{CE} Sensing for IGBT Protection in NPC Three Level Converters—Causes For Spurious Trippings and Their Elimination
Author :
Jain, Amit Kumar ; Ranganathan, V.T.
Author_Institution :
Dept. of Electr. Eng., Indian Inst. of Sci., Bangalore, India
Volume :
26
Issue :
1
fYear :
2011
Firstpage :
298
Lastpage :
307
Abstract :
Neutral point clamped (NPC), three level converters with insulated gate bipolar transistor devices are very popular in medium voltage, high power applications. DC bus short circuit protection is usually done, using the sensed voltage across collector and emitter (i.e., VCE sensing), of all the devices in a leg. This feature is accommodated with the conventional gate drive circuits used in the two level converters. The similar gate drive circuit, when adopted for NPC three level converter protection, leads to false VCE fault signals for inner devices of the leg. The paper explains the detailed circuit behavior and reasons, which result in the occurrence of such false VCE fault signals. This paper also illustrates that such a phenomenon shows dependence on the power factor of the supplied three-phase load. Finally, experimental results are presented to support the analysis. It is shown that the problem can be avoided by blocking out the VCE sense fault signals of the inner devices of the leg.
Keywords :
driver circuits; insulated gate bipolar transistors; power convertors; power factor; short-circuit currents; DC bus short circuit protection; IGBT protection; fault signals; gate drive circuits; insulated gate bipolar transistor; neutral point clamped three level converters; power factor; Circuit faults; Circuit topology; Converters; Insulated gate bipolar transistors; Leg; Logic gates; Medium voltage; Permission; Protection; Reactive power; Sensors; Snubbers; Switches; Switching circuits; Gate drive circuit; multilevel converter; neutral point clamped (NPC); short circuit protection;
fLanguage :
English
Journal_Title :
Power Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-8993
Type :
jour
DOI :
10.1109/TPEL.2010.2060358
Filename :
5535192
Link To Document :
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