Title :
Effects of photoexcited carriers on dynamic response of quantum-well optical modulators
Author :
Nojima, S. ; Larsen, P.D. ; Larsen, A.-D. ; Mitomi, O. ; Wakita, Ken ; Naganuma, M.
Author_Institution :
NTT Opto-electron. Lab., Kanagawa, Japan
fDate :
7/18/1991 12:00:00 AM
Abstract :
The dynamic response of quantum-well optical modulators in the intrinsic domain is discussed on the basis of a proposed simple model, characterised by the following two processes: excitonic response and photoexcited-carrier relaxation. The response is found to be enhanced in a certain region of modulation frequency and optical power density (quasiresonance phenomena). Comparison between the two most promising quantum-well materials (InGaAs-InP and InGaAs-InAlAs) indicates that the former is more liable to be affected by the photoexcited carriers than the latter.
Keywords :
carrier lifetime; carrier relaxation time; dynamic response; electro-optical devices; optical modulation; semiconductor device models; semiconductor quantum wells; InGaAs-InAlAs; InGaAs-InP; SQW; dynamic response; electrooptical devices; excitonic response; model; modulation frequency; optical power density; photoexcited carriers; photoexcited-carrier relaxation; quantum-well optical modulators; quasiresonance phenomena;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19910871