Title :
Test and measurement of SAW devices. A technology overview
Author :
Elliot, Scott ; Bray, Robert
Author_Institution :
Hewlett-Packard, Santa Rosa Technology Centre, Santa Rosa, USA
fDate :
2/1/1985 12:00:00 AM
Abstract :
The new generation of surface-acoustic-wave devices now available is opening up several new application areas. But, such is their speed and complexity, they are creating their own problems requiring accurate sophisticated test instruments
Journal_Title :
Electronics and Power
DOI :
10.1049/ep.1985.0099
