DocumentCode
1283812
Title
Improved performance due to suppression of spontaneous emission in tensile-strain semiconductor lasers
Author
O´Reilly, E.P. ; Jones, Glenn ; Ghiti, A. ; Adams, A.R.
Author_Institution
Dept. of Phys., Surrey Univ., Guildford, UK
Volume
27
Issue
16
fYear
1991
Firstpage
1417
Lastpage
1419
Abstract
It is shown that application of biaxial tension to the active region of a bulk or quantum well semiconductor laser can significantly enhance TM gain compared to TE gain and reduce the threshold current density, due to suppression of spontaneous emission polarised in the growth plane of the laser structure. The differential gain is enhanced compared to unstrained structures and a larger peak gain can be achieved than in comparable structures under biaxial compression.
Keywords
semiconductor junction lasers; TM gain enhancement; active region; biaxial tension; bulk semiconductor lasers; differential gain; peak gain; performance improvement; quantum well semiconductor laser; suppression of spontaneous emission; tensile-strain semiconductor lasers; threshold current density reduction;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19910889
Filename
81277
Link To Document