• DocumentCode
    1283812
  • Title

    Improved performance due to suppression of spontaneous emission in tensile-strain semiconductor lasers

  • Author

    O´Reilly, E.P. ; Jones, Glenn ; Ghiti, A. ; Adams, A.R.

  • Author_Institution
    Dept. of Phys., Surrey Univ., Guildford, UK
  • Volume
    27
  • Issue
    16
  • fYear
    1991
  • Firstpage
    1417
  • Lastpage
    1419
  • Abstract
    It is shown that application of biaxial tension to the active region of a bulk or quantum well semiconductor laser can significantly enhance TM gain compared to TE gain and reduce the threshold current density, due to suppression of spontaneous emission polarised in the growth plane of the laser structure. The differential gain is enhanced compared to unstrained structures and a larger peak gain can be achieved than in comparable structures under biaxial compression.
  • Keywords
    semiconductor junction lasers; TM gain enhancement; active region; biaxial tension; bulk semiconductor lasers; differential gain; peak gain; performance improvement; quantum well semiconductor laser; suppression of spontaneous emission; tensile-strain semiconductor lasers; threshold current density reduction;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19910889
  • Filename
    81277