Title :
Reducing the Storage Requirements of a Test Sequence by Using One or Two Background Vectors
Author :
Pomeranz, Irith ; Reddy, Sudhakar M.
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
Abstract :
We describe a storage scheme for functional test sequences where a test sequence T is associated with a primary input vector B called a background vector. T is stored by storing only the differences between its test vectors and B . We describe a procedure for computing a background vector B for a given test sequence T. We also describe a procedure that modifies T so as to reduce its storage requirements with respect to B . We present experimental results demonstrating that the single background vector B, computed based on T, allows T to be modified such that a vast majority of its entries are equal to the corresponding entries of B. Consequently, storage of T reduces to storage of a small number of entries. We also extend the discussion to storage of T based on two background vectors. A second background vector provides more flexibility in storing T as a list of entries where it is different from its background vectors. This contributes to a further reduction in storage requirements for certain circuits.
Keywords :
digital storage; logic testing; sequential circuits; background vectors; flexibility; functional test sequence; storage requirements; storage scheme; Automatic testing; Circuit faults; Circuit testing; Delay; Electrical fault detection; Encoding; Fault detection; Life testing; Sequential analysis; Sequential circuits; Functional test sequence; stuck-at faults; synchronous sequential circuits; test data storage;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2010.2055588