DocumentCode
1284104
Title
Lateral-mode analysis of narrow-stripe semiconductor lasers with a cylindrically concave end facet
Author
Champagne, Yves ; McCarthy, Nathalie
Author_Institution
Dept. of Phys., Laval Univ., Sainte-Foy, Que., Canada
Volume
27
Issue
3
fYear
1991
fDate
3/1/1991 12:00:00 AM
Firstpage
321
Lastpage
331
Abstract
A beam-propagation method is used to investigate numerically the lateral-mode characteristics of GaAlAs semiconductor lasers having a cylindrically concave facet at one end. Various degrees of index guiding have been considered. Simulations were made for both below- and above-threshold regimes. As expected, the numerical results show that the optical beam divergence parallel to the junction plane can be significantly reduced. In addition, this far-field narrowing is accompanied by lower threshold currents. However, for values of the radius of curvature of the concave facet lying in some specific ranges, the losses of the fundamental lateral mode are higher than that calculated for conventional lasers, and the corresponding eigenvalue shows nonmonotonic variations as the injection current is increased. This phenomenon is due to an enhancement of the index antiguiding over the gain-guiding mechanism
Keywords
III-V semiconductors; aluminium compounds; gallium arsenide; laser modes; optical waveguides; refractive index; semiconductor junction lasers; GaAsAs semiconductor lasers; beam-propagation method; cylindrically concave end facet; eigenvalue; far-field narrowing; fundamental lateral mode; gain-guiding mechanism; index antiguiding; index guiding; injection current; junction plane; lateral-mode characteristics; losses; narrow-stripe semiconductor lasers; nonmonotonic variations; numerical results; optical beam divergence; radius of curvature; simulations; threshold currents; Etching; Laser beams; Laser modes; Laser theory; Optical beams; Optical coupling; Optical losses; Optical resonators; Semiconductor lasers; Threshold current;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/3.81330
Filename
81330
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