DocumentCode :
1284816
Title :
Invitation to Membership in the Reliability Society
Volume :
48
Issue :
4
fYear :
1999
Firstpage :
422
Lastpage :
422
Keywords :
Books; Electron devices; IEEE members; Marine vehicles; Materials reliability; Meetings; Membership renewal; Reliability engineering; Semiconductor device reliability; USA Councils;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/TR.1999.814525
Filename :
814525
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1284816
