DocumentCode
1284816
Title
Invitation to Membership in the Reliability Society
Volume
48
Issue
4
fYear
1999
Firstpage
422
Lastpage
422
Keywords
Books; Electron devices; IEEE members; Marine vehicles; Materials reliability; Meetings; Membership renewal; Reliability engineering; Semiconductor device reliability; USA Councils;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.1999.814525
Filename
814525
Link To Document