Title :
5.6 Gb/s receiver with electrical overstress protection for GDDR in a 45 nm CMOS
Author :
Sumesaglam, Taner ; Song, Rachel ; Murray, G.R. ; Guerra, Alexandre
Author_Institution :
Intel Corp., Folsom, CA, USA
fDate :
7/1/2011 12:00:00 AM
Abstract :
A receiver circuit with built-in electrical overstress protection for a graphics double data rate, version 5 (GDDR5) interface is proposed. The new circuit in a fully functional memory controller system is fabricated in a 45 nm CMOS process using only native thin-gate transistors. The receiver s functionality and performance are experimentally verified at 5.6 Gb/s with 20 ps set-up/hold and 54 mVpp voltage uncertainty with better than 10-12 bit error rate (BER).
Keywords :
CMOS integrated circuits; electrostatic discharge; error statistics; transistors; BER; CMOS; GDDR5; bit error rate; bit rate 5.6 Gbit/s; electrical overstress protection; graphics double data rate; memory controller system; receiver circuit; size 45 nm; thin-gate transistor;
Journal_Title :
Circuits, Devices & Systems, IET
DOI :
10.1049/iet-cds.2010.0212