DocumentCode :
1285117
Title :
EPAS: an emitter piloting advisory expert system for IC emitter deposition
Author :
Yang, Ying-Kuei
Author_Institution :
Harris Semicond., Melbourne, FL, USA
Volume :
3
Issue :
2
fYear :
1990
fDate :
5/1/1990 12:00:00 AM
Firstpage :
45
Lastpage :
53
Abstract :
Emitter piloting is a difficult diffusion process in IC manufacturing. The decision for the adjustment of the piloting drive cycle is a heuristic-oriented task. An expert system, the emitter piloting advisory system (EPAS), is used at Harris Semiconductor to advise fab operators on how to adjust piloting cycle time for emitters based on knowledge extracted from the most experienced engineer. EPAS consists of an input filter to validate the input parameter values; a knowledge base containing the knowledge extracted from the domain expert; a limited learning mechanism for dynamically calculating a better estimate of initial drive time for the next lot; a convergence control mechanism to control the rule inference so that the result of an inference is always closer to the conclusion; a user facility module containing many LISP-based modules developed to let the expert, engineers, and operators maintain the system by themselves; and a user-friendly interface. One EPAS operation example is provided
Keywords :
bipolar integrated circuits; diffusion in solids; electronic engineering computing; expert systems; integrated circuit manufacture; learning systems; manufacturing data processing; process control; user interfaces; EPAS; Harris Semiconductor; IC emitter deposition; IC manufacturing; LISP-based modules; convergence control mechanism; diffusion process; emitter piloting advisory system; expert system; extracted knowledge; heuristic-oriented task; input parameter values; knowledge base; limited learning mechanism; piloting cycle time adjustment; rule inference; user facility module; user-friendly interface; Control systems; Convergence; Diffusion processes; Expert systems; Filters; Knowledge engineering; Learning systems; Maintenance engineering; Manufacturing processes; Semiconductor device manufacture;
fLanguage :
English
Journal_Title :
Semiconductor Manufacturing, IEEE Transactions on
Publisher :
ieee
ISSN :
0894-6507
Type :
jour
DOI :
10.1109/66.53186
Filename :
53186
Link To Document :
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