DocumentCode :
1285318
Title :
Improvements in reliability of VLSI integrated circuits
Author :
Noble, Mike
Author_Institution :
Hi-Tek Electronics Ltd., Cambridge, UK
Volume :
31
Issue :
3
fYear :
1985
fDate :
3/1/1985 12:00:00 AM
Firstpage :
222
Lastpage :
226
Abstract :
Production of integrated circuits to military and high-reliability specifications cannot be learned overnight. Special attention must be given to semiconductor processes and circuit design techniques, and it can take years to develop such a capability
fLanguage :
English
Journal_Title :
Electronics and Power
Publisher :
iet
ISSN :
0013-5127
Type :
jour
DOI :
10.1049/ep.1985.0151
Filename :
5188658
Link To Document :
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