DocumentCode :
1285469
Title :
A Self-Checking Approach for SEU/MBUs-Hardened FSMs Design Based on the Replication of One-Hot Code
Author :
Yuanqing, Li ; Suying, Yao ; Jiangtao, Xu ; Jing, Gao
Author_Institution :
Sch. of Electron. Inf. Eng., Tianjin Univ., Tianjin, China
Volume :
59
Issue :
5
fYear :
2012
Firstpage :
2572
Lastpage :
2579
Abstract :
As technology scales, the protection of Finite State Machines´ (FSMs) states against single event upset (SEU) and multiple bit upsets (MBUs) becomes more difficult. In this paper, a self-checking approach to enhance the SEU/MBUs immunity of FSMs´ states by replicating One-Hot code times for state encoding is presented. This approach can correct less than bit-flip faults in the state register per cycle. Bit-flips are treated as random events and modeled by applying Poisson distribution. Two characteristics of this approach are obtained through probability analysis: first, this approach performs better with the increase of , whereas worse when an FSM contains more states; second, this approach can offer more enhanced reliability than Binary or One-Hot state encoding with Triple Modular Redundancy (TMR). The former characteristic leads to the further improvement of this approach which is called state-reforming. The reliabilities of this proposed approach and its state-reformed solutions, as well as are all evaluated through simulations of fault injections.
Keywords :
Poisson distribution; finite state machines; high energy physics instrumentation computing; nuclear electronics; MBU hardened FSM; Poisson distribution; SEU hardened FSM; TMR; binary encoding; bit flip faults; finite state machine; multiple bit upsets; one hot code; one hot state encoding; probability analysis; random events; self checking approach; single event upset; triple modular redundancy; Encoding; Hardware; Redundancy; Registers; Single event upset; Tunneling magnetoresistance; FSMs; MBUs; Poisson distribution; SEU; mean-time-between-failures;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2012.2212209
Filename :
6303852
Link To Document :
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