• DocumentCode
    1285469
  • Title

    A Self-Checking Approach for SEU/MBUs-Hardened FSMs Design Based on the Replication of One-Hot Code

  • Author

    Yuanqing, Li ; Suying, Yao ; Jiangtao, Xu ; Jing, Gao

  • Author_Institution
    Sch. of Electron. Inf. Eng., Tianjin Univ., Tianjin, China
  • Volume
    59
  • Issue
    5
  • fYear
    2012
  • Firstpage
    2572
  • Lastpage
    2579
  • Abstract
    As technology scales, the protection of Finite State Machines´ (FSMs) states against single event upset (SEU) and multiple bit upsets (MBUs) becomes more difficult. In this paper, a self-checking approach to enhance the SEU/MBUs immunity of FSMs´ states by replicating One-Hot code times for state encoding is presented. This approach can correct less than bit-flip faults in the state register per cycle. Bit-flips are treated as random events and modeled by applying Poisson distribution. Two characteristics of this approach are obtained through probability analysis: first, this approach performs better with the increase of , whereas worse when an FSM contains more states; second, this approach can offer more enhanced reliability than Binary or One-Hot state encoding with Triple Modular Redundancy (TMR). The former characteristic leads to the further improvement of this approach which is called state-reforming. The reliabilities of this proposed approach and its state-reformed solutions, as well as are all evaluated through simulations of fault injections.
  • Keywords
    Poisson distribution; finite state machines; high energy physics instrumentation computing; nuclear electronics; MBU hardened FSM; Poisson distribution; SEU hardened FSM; TMR; binary encoding; bit flip faults; finite state machine; multiple bit upsets; one hot code; one hot state encoding; probability analysis; random events; self checking approach; single event upset; triple modular redundancy; Encoding; Hardware; Redundancy; Registers; Single event upset; Tunneling magnetoresistance; FSMs; MBUs; Poisson distribution; SEU; mean-time-between-failures;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2012.2212209
  • Filename
    6303852