DocumentCode :
12855
Title :
Recovery After Potential-Induced Degradation of CuIn _{{\\bf 1}-{bm x}} Ga _{bm x} Se
Author :
Fjallstrom, V. ; Szaniawski, P. ; Vermang, B. ; Salome, P.M.P. ; Rostvall, F. ; Zimmermann, U. ; Edoff, M.
Author_Institution :
Ångstrom Lab., Uppsala Univ., Uppsala, Sweden
Volume :
5
Issue :
2
fYear :
2015
fDate :
Mar-15
Firstpage :
664
Lastpage :
669
Abstract :
This study deals with potential-induced degradation (PID) of Cu(In,Ga)Se2-based solar cells and different approaches to subsequent recovery of efficiency. Three different recovery methods were studied: 1) etch recovery, 2) accelerated recovery, and 3) unaccelerated recovery. After being completely degraded, the solar cells with CdS buffer layers recovered their efficiencies at different rates, depending on the method which was used. On the other hand, if Zn(O,S) was used as a buffer layer instead of CdS, the recovery rate was close to zero. The buffer layer type clearly influenced the sodium distribution during PID stressing and recovery, as well as the possibilities for recovery of the electrical performance.
Keywords :
II-VI semiconductors; buffer layers; cadmium compounds; copper compounds; etching; gallium compounds; indium compounds; recovery; solar cells; wide band gap semiconductors; zinc compounds; CuIn1-xGaxSe2-CdS; CuIn1-xGaxSe2-ZnOS; accelerated recovery; buffer layers; electrical performance; etch recovery; potential-induced degradation; solar cells; unaccelerated recovery; Acceleration; Buffer layers; Degradation; Glass; Photovoltaic cells; Stress; Thyristors; Buffer layer; Cu(In,Ga)Se2 (CIGS); potential-induced degradation (PID); thin-film solar cells;
fLanguage :
English
Journal_Title :
Photovoltaics, IEEE Journal of
Publisher :
ieee
ISSN :
2156-3381
Type :
jour
DOI :
10.1109/JPHOTOV.2014.2384839
Filename :
7006652
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