• DocumentCode
    1285525
  • Title

    Adhesion issues in flip-chip on organic modules

  • Author

    Tran, Son K. ; Questad, Dave L. ; Sammakia, Bahgat G.

  • Author_Institution
    Div. of Microelectron., IBM Corp., Endicott, NY, USA
  • Volume
    22
  • Issue
    4
  • fYear
    1999
  • fDate
    12/1/1999 12:00:00 AM
  • Firstpage
    519
  • Lastpage
    524
  • Abstract
    Flip chip attach on organic carriers is a novel electronic packaging assembly method which provides advantages of high input/output (I/O) counts, electrical performance and thermal dissipation. In this structure, the flip chip device is attached to organic laminate with predeposited eutectic solder. Mechanical coupling of the chip and the laminate is done via underfill encapsulant materials. As the chip size increases, the thermal mismatch between silicon and its organic carrier becomes greater. Adhesion becomes an important factor since the C4 joints fail quickly if delamination of the underfill from either chip or the solder mask interface occurs. Newly developed underfills have been studied to examine their properties, including interfacial adhesion strength, flow characteristics, void formation and cure kinetics. This paper will describe basic investigations into the properties of these underfills and also how these properties related to the overall development process. In addition, experiments were performed to determine the effects on adhesion degradation of flip chip assembly processes and materials such as IR reflow profile, flux quantity and residues. Surface treatment of both the chip and the laminate prior to encapsulation were studied to enhance underfill adhesion. Accelerated thermal cycling and highly accelerated stress testing (HAST) were conducted to compare various underfill properties and reliability responses
  • Keywords
    adhesion; delamination; encapsulation; flip-chip devices; fracture toughness; integrated circuit packaging; integrated circuit reliability; life testing; reflow soldering; voids (solid); I/O counts; IR reflow profile; accelerated stress testing; accelerated thermal cycling; adhesion; cure kinetics; delamination; electrical performance; electronic packaging assembly method; flip chip attach; flip-chip on organic modules; flow characteristics; flux quantity; mechanical coupling; organic carriers; organic laminate; reliability responses; residues; solder mask interface; thermal dissipation; thermal mismatch; underfill encapsulant materials; void formation; Adhesives; Assembly; Delamination; Electronic packaging thermal management; Electronics packaging; Flip chip; Laminates; Life estimation; Silicon; Thermal stresses;
  • fLanguage
    English
  • Journal_Title
    Components and Packaging Technologies, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3331
  • Type

    jour

  • DOI
    10.1109/6144.814967
  • Filename
    814967