DocumentCode :
1285567
Title :
Numerical analysis of fine lead bonding-effect of pad mechanical properties on interfacial deformation
Author :
Takahashi, Yasuo ; Inoue, Michinobu ; Inoue, Katsunori
Author_Institution :
Joining & Welding Res. Inst., Osaka Univ., Japan
Volume :
22
Issue :
4
fYear :
1999
fDate :
12/1/1999 12:00:00 AM
Firstpage :
558
Lastpage :
566
Abstract :
The present study was carried out for the purpose of understanding solid state inner and middle lead bonding, especially the effect of pad mechanical properties on the interfacial deformation processes between lead and pad based on a computer simulation that was carried out by using a finite element method (FEM). As the mechanical properties largely depend on temperature, we discuss the influence of temperature on the effect of pad mechanical properties, i.e., the pad temperature is different from the lead temperature. It is suggested that the interfacial extension reaches greater than 20% for only 10% lead reduction as the pad temperature is 200 K higher than the lead temperature. We further discuss the effect of the substrate temperature on the bond strength, based on the calculated and experimental results
Keywords :
deformation; digital simulation; finite element analysis; integrated circuit packaging; lead bonding; bond strength; computer simulation; fine lead bonding; finite element method; inner lead bonding; interfacial deformation; interfacial extension; middle lead bonding; pad mechanical properties; pad temperature; substrate temperature; Atherosclerosis; Bonding processes; Capacitive sensors; Deformable models; Gold; Lead; Mechanical factors; Numerical analysis; Stress; Temperature dependence;
fLanguage :
English
Journal_Title :
Components and Packaging Technologies, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3331
Type :
jour
DOI :
10.1109/6144.814972
Filename :
814972
Link To Document :
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