Title :
Dielectric properties and partial discharge endurance of polypropylene-silica nanocomposite
Author :
Takala, M. ; Ranta, H. ; Nevalainen, P. ; Pakonen, P. ; Pelto, J. ; Karttunen, M. ; Virtanen, S. ; Koivu, V. ; Pettersson, M. ; Sonerud, B. ; Kannus, K.
Author_Institution :
Tampere Univ. of Technol., Tampere, Finland
fDate :
8/1/2010 12:00:00 AM
Abstract :
This paper presents the results of the dielectric properties and partial discharge endurance measurements conducted on polypropylene (PP)-silica nanocomposite. The material compounds were analyzed with micro-Raman spectroscopy, X-ray tomography and transmission electron microscopy (TEM). ac and dc breakdown strength of the materials was measured. Dielectric response, capacitance and loss factor of the film samples were measured as a function of temperature and frequency. Partial discharge (PD) endurance of the reference PP and PP Silica nanocomposite was studied as a function of ac voltage. Material surfaces were analyzed after PD stress with optical microscopy. All dielectric measurements were done for oriented thin films with a thickness of 11-23 μm. The results were analyzed statistically to determine the effects of the additive on the properties of PP. The paper discusses the potential of PP Silica nanocomposite with a view to high voltage applications, especially power capacitors.
Keywords :
Raman spectra; capacitance; dielectric losses; dielectric thin films; electric breakdown; filled polymers; nanocomposites; optical microscopy; particle reinforced composites; permittivity; silicon compounds; transmission electron microscopy; AC breakdown strength; DC breakdown strength; SiO2; TEM; X-ray tomography; capacitance; dielectric loss factor; dielectric properties; dielectric thin film; microRaman spectroscopy; optical microscopy; partial discharge endurance; polypropylene-silica nanocomposite; power capacitors; size 11 mum to 23 mum; transmission electron microscopy; Conducting materials; Dielectric loss measurement; Dielectric materials; Dielectric measurements; Materials; Optical films; Optical materials; Partial discharge measurement; Partial discharges; Silicon compounds; Temperature measurement; Transmission electron microscopy;
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
DOI :
10.1109/TDEI.2010.5539698