DocumentCode :
1286161
Title :
Robust Level Converter for Sub-Threshold/Super-Threshold Operation:100 mV to 2.5 V
Author :
Chang, Ik Joon ; Kim, Jae-Joon ; Kim, Keejong ; Roy, Kaushik
Author_Institution :
Dept. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
Volume :
19
Issue :
8
fYear :
2011
Firstpage :
1429
Lastpage :
1437
Abstract :
For ultra low power application, digital sub-threshold logic design has been explored. Extremely low power supply (VDD) of sub-threshold logic results in significant power reduction. However, it is difficult to convert signals from core logic to input/output (I/O) circuits since core VDD is vastly different from high I/O supply voltage. In this work, we propose a level converter based on dynamic logic style for sub-threshold I/O part, having a large dynamic range of conversion. For the level converter, high voltage clock signal needs to be delivered through separate clock path from core logic, leading to clock synchronization problem between high voltage and low voltage clocks. To overcome this issue, we employed a Clock Synchronizer. A test chip is fabricated in 130-nm CMOS technology in order to verify the proposed technique. Hardware measurement results show that the level converter successfully converts 0.3 V 8 MHz pulse to 2.5 V signal.
Keywords :
CMOS logic circuits; convertors; logic design; CMOS technology; VDD; clock synchronization problem; digital subthreshold logic design; frequency 8 MHz; hardware measurement; high voltage clock signal; input-output circuits; power reduction; robust level converter; size 130 nm; subthreshold-super-threshold operation; voltage 100 mV to 2.5 V; CMOS technology; Clocks; Dynamic range; Logic circuits; Logic design; Low voltage; Power supplies; Pulse measurements; Robustness; Synchronization; Level converter; subthreshold logic; subthreshold operation; ultra-low voltage operation;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2010.2051240
Filename :
5540270
Link To Document :
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