DocumentCode :
1286605
Title :
Reduced dimension robust Capon beamforming for large aperture passive sonar arrays
Author :
Somasundaram, Samuel D.
Author_Institution :
Thales Underwater Syst., Stockport, UK
Volume :
5
Issue :
7
fYear :
2011
fDate :
8/1/2011 12:00:00 AM
Firstpage :
707
Lastpage :
715
Abstract :
In passive sonar, adaptive beamforming can be used to increase the array output signal-to-interference-plus-noise ratio (SINR) over delay-and-sum techniques, provided that array steering vector (ASV) and covariance matrix errors are accounted for. By exploiting ellipsoidal sets of the ASV, robust Capon beamformers (RCBs) systematically allow for ASV errors. For large aperture, many-element passive sonar arrays, the computational and sample support requirements often make element-space beamforming unfeasible and one is forced to consider reduced-dimension techniques. Here, a framework is proposed for combining reduced-dimension and RCB methods, producing rapidly converging, low complexity reduced-dimension RCBs (RDRCBs) allowing for ASV errors. The key contribution is the derivation of reduced-dimension ellipsoids, used by the RDRCBs, from typically available element-space sets and the dimension-reducing transformation(s) via propagation. The method allows for any ellipsoidal element-space ASV set and any full (column) rank dimension-reducing transformation. Here, for the application, the author considers the use of beamspace techniques within the RDRCB framework. The SINR of the RDRCBs are analysed, showing where they can outperform their element-space counter-parts. The benefits of using the RDRCBs are illustrated on experimental passive sonar data.
Keywords :
array signal processing; covariance matrices; sonar arrays; ASV error; RCB method; adaptive beamforming; aperture passive sonar array; array steering vector; beamspace technique; covariance matrix; delay and sum technique; reduced dimension technique; robust Capon beamformer;
fLanguage :
English
Journal_Title :
Radar, Sonar & Navigation, IET
Publisher :
iet
ISSN :
1751-8784
Type :
jour
DOI :
10.1049/iet-rsn.2010.0351
Filename :
5967999
Link To Document :
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