Title :
Time resolved bit error rate analysis of a fast switching tunable laser for use in optically switched networks
Author :
O´Dowd, John A. ; Shi, Kai ; Walsh, Anthony J. ; Bessler, Vivian M. ; Smyth, Frank ; Huynh, Tam N. ; Barry, Liam P. ; Ellis, Andrew D.
Author_Institution :
Intune Networks, Dublin, Ireland
Abstract :
We investigate the use of different direct detection modulation formats in a wavelength switched optical network. We find the minimum time it takes a tunable sampled grating distributed Bragg reflector laser to recover after switching from one wavelength channel to another for different modulation formats. The recovery time is investigated utilizing a field programmable gate array which operates as a time resolved bit error rate detector. The detector offers 93 ps resolution operating at 10.7 Gb/s and allows for all the data received to contribute to the measurement, allowing low bit error rates to be measured at high speed. The recovery times for 10.7 Gb/s non-return-to-zero on-off keyed modulation, 10.7 Gb/s differentially phase shift keyed signal and 21.4 Gb/s differentially quadrature phase shift keyed formats can be as low as 4 ns, 7 ns and 40 ns, respectively. The time resolved phase noise associated with laser settling is simultaneously measured for 21.4 Gb/s differentially quadrature phase shift keyed data and it shows that the phase noise coupled with frequency error is the primary limitation on transmitting immediately after a laser switching event.
Keywords :
diffraction gratings; distributed Bragg reflector lasers; error statistics; field programmable gate arrays; integrated optoelectronics; optical communication equipment; optical fibre networks; optical switches; quadrature phase shift keying; bit error rate detector; bit rate 10.7 Gbit/s; bit rate 21.4 Gbit/s; differentially phase shift keyed signal; differentially quadrature phase shift keyed format; direct detection modulation format; fast switching tunable laser; field programmable gate array; frequency error; optically switched network; phase noise; time resolved bit error rate analysis; tunable sampled grating distributed Bragg reflector laser; wavelength switched optical network; Adaptive optics; Bit error rate; Field programmable gate arrays; Laser noise; Measurement by laser beam; Optical switches; Packet switching; Time resolved error detector; Tunable laser; Wavelength switching;
Journal_Title :
Optical Communications and Networking, IEEE/OSA Journal of
DOI :
10.1364/JOCN.4.000A77