DocumentCode
1287324
Title
Domain structures and dielectric properties resulting from tweed precursors of relaxor ferroelectric solid-solution single-crystal 24Pb(In1/2Nb1/2)O3-46Pb (Mg1/3Nb2/3)O3-30PbTio3
Author
Yasuda, N.Y. ; Nur Hidayah, Z.A. ; Ohwa, H.O. ; Tachi, Y.T. ; Yamashita, Y.Y.
Author_Institution
Dept. of Electr. & Electron. Eng., Gifu Univ., Gifu, Japan
Volume
59
Issue
9
fYear
2012
fDate
9/1/2012 12:00:00 AM
Firstpage
1919
Lastpage
1924
Abstract
The domain structures of poled and depoled lead-based relaxor ferroelectric solid-solution single-crystal 24Pb(In1/2Nb1/2)O3-46Pb (Mg1/3Nb2/3)O3-30PbTio3 are studied by polarized light microscopy, piezoresponse force microscopy (PFM), scanning electron microscopy (SEM), and dielectric spectroscopy. The domain structures in the nonergodic relaxor state are found by PFM to consist of tweed structures resulting from random fields from the competition between ferroelectric and antiferroelectric distortion, and planar defects found by SEM are treated as dislocations associated with strain accommodation, resulting in superior piezoelectric properties. This domain structure is found to be connected with hierarchical domain structures.
Keywords
antiferroelectricity; dislocations; electric domains; lead compounds; optical microscopy; piezoelectricity; relaxor ferroelectrics; scanning electron microscopy; solid solutions; Pb(In0.5Nb0.5)O3-Pb(Mg0.33Nb0.67)O3-PbTiO3; SEM; antiferroelectric distortion; depoled lead-based relaxor ferroelectric solid-solution single-crystal; dielectric properties; dielectric spectroscopy; dislocations; hierarchical domain structures; nonergodic relaxor state; piezoelectric properties; piezoresponse force microscopy; planar defects; polarized light microscopy; random fields; scanning electron microscopy; strain accommodation; tweed precursors; tweed structures; Crystals; Dielectrics; Periodic structures; Relaxor ferroelectrics; Scanning electron microscopy; Strain;
fLanguage
English
Journal_Title
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher
ieee
ISSN
0885-3010
Type
jour
DOI
10.1109/TUFFC.2012.2407
Filename
6306009
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