DocumentCode :
1287479
Title :
Optimization of Bonding Force, Sinking Value, and Potting Gap Size in COF Inner Lead Bonding Process
Author :
Liu, De-Shin ; Yeh, Shu-Shen ; Kao, Chun-Teh ; Shen, Hung-Che ; Shen, Geng-Shin ; Liu, Hung-Hsin
Author_Institution :
Dept. of Mech. Eng., Nat. Chung Cheng Univ., Ming-Hsiung, Taiwan
Volume :
32
Issue :
3
fYear :
2009
Firstpage :
593
Lastpage :
601
Abstract :
The thermo-mechanical properties of the polyimide film used in chip-on-film (COF) packaging have a significant effect on the inner lead bonding (ILB) mechanism. Furthermore, specifying an appropriate bonding force is essential in establishing a suitable compromise between a good bonding strength in the ILB process and a suitable gap size for the subsequent resin potting process. This paper commences by performing a series of experimental micro-force tensile tests to investigate the stress-strain relations of two polyimide films, namely Kapton-EN and Espanex-M. The tests are performed using formfitting specimens from actual COF products at various temperatures ranging from 25degC to 200degC . Based on the experimental results, constitutive equations are developed to model the temperature-dependent stress-strain characteristics of the two films. A finite element model of the COF/system comprising the thermo-compression tool, the polyimide film, the copper lead and the gold bump is constructed and is used to simulate the ILB process under various bonding forces. A good agreement is found between the experimental and numerical results obtained for the deformed profile of a single polyimide/copper lead following the bonding process and the variation of the bump sinking value with the bonding force, respectively. The numerical results are used to construct COF/ILB parameter design charts for the Kapton-EN and Espanex-M polyimide films which enable suitable values of the bonding force to be selected for given gap size and bump sinking values. In general, the results show that Kapton-EN has a broader working range than Espanex-M as a result of its higher elastic stiffness. When performing the ILB process using Espanex-M polyimide film, it is necessary to carefully control the bonding force to ensure that the minimum potting gap size is maintained.
Keywords :
chip-on-board packaging; lead bonding; polymer films; stress-strain relations; thermomechanical treatment; Espanex-M films; Kapton-EN films; bonding force; bump sinking value; chip-on-fllm packaging; finite element model; inner lead bonding; micro-force tensile tests; polyimide film; potting gap size; resin potting; stress-strain relations; temperature 25 degC to 200 degC; thermo-compression; thermo-mechanical properties; Bonding forces; Bonding processes; Copper; Mechanical factors; Packaging; Performance evaluation; Polyimides; Resins; Testing; Thermomechanical processes; Chip-on-film (COF); finite element analysis (FEA); inner lead bonding (ILB); polyimide film; tape automated bonding (TAB);
fLanguage :
English
Journal_Title :
Advanced Packaging, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3323
Type :
jour
DOI :
10.1109/TADVP.2009.2025671
Filename :
5191298
Link To Document :
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