PVT Compensation for Wilkinson Single-Slope Measurement Systems

Author

Tham, K.V. ; Ulaganathan, C. ; Nambiar, N. ; Greenwell, R.L. ; Britton, C.L. ; Ericson, M.N. ; Holleman, J. ; Blalock, B.J.

Author_Institution

Intel Corp., Santa Clara, CA, USA

Volume

59

Issue

5

fYear

2012

Firstpage

2444

Lastpage

2450

Abstract

A pulse-width locked loop (PWLL) circuit is reported that compensates for process, voltage, and temperature (PVT) variations of a linear ramp generator within a 12-bit multi-channel Wilkinson (single-slope integrating) Analog-to-Digital converter (ADC). This PWLL was designed and fabricated in a 0.5- μm Silicon Germanium (SiGe) BiCMOS process. Simulation and silicon measurement data are shown that demonstrate a large improvement in the accuracy of the PVT-compensated ADC over the uncompensated ADC.

Keywords

BiCMOS digital integrated circuits; analogue-digital conversion; nuclear electronics; ramp generators; PVT compensation; PWLL circuit; SiGe BiCMOS process; Wilkinson single slope measurement systems; linear ramp generator; multichannel Wilkinson ADC; process-voltage-temperature variations; pulse width locked loop circuit; silicon germanium BiCMOS process; single slope integrating ADC; Accuracy; Capacitors; Charge pumps; Detectors; Generators; Pulse width modulation; Temperature measurement; Analog-to-digital converter (ADC); PWLL; linear system; process, voltage, and temperature (PVT) compensation; pulse-width modulator (PWM); single-slope measurement systems;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2012.2212722

Filename

6307900