A frequency response, harmonic distortion, and intermodulation distortion test for BIST of a sigma-delta ADC

Author

Toner, M.F. ; Roberts, G.W.

Author_Institution

Dept. of Electr. Eng., McGill Univ., Montreal, Que., Canada

Volume

43

Issue

8

fYear

1996

fDate

8/1/1996 12:00:00 AM

Firstpage

608

Lastpage

613

Abstract

Built-In-Self-Test (BIST) for VLSI systems is desirable for production-line testing and in-the-field diagnostics. This brief discusses a Mixed Analog-Digital BIST (MADBIST) for a frequency response test, a harmonic distortion test and an intermodulation distortion test of an analog-to-digital converter. The MADBIST strategy for the frequency response, harmonic distortion, and intermodulation distortion tests of the ADC is introduced, accuracy issues are discussed, and preliminary experimental results are presented

Keywords

VLSI; built-in self test; frequency response; harmonic distortion; integrated circuit testing; intermodulation distortion; mixed analogue-digital integrated circuits; sigma-delta modulation; IMD test; VLSI systems; accuracy; analog-to-digital converter; frequency response test; harmonic distortion test; intermodulation distortion test; mixed analog-digital BIST; production-line testing; sigma-delta ADC; Built-in self-test; Cellular networks; Cellular neural networks; Circuit testing; Frequency response; Harmonic distortion; Intermodulation distortion; Neural networks; Optical interconnections; Optical receivers;

fLanguage

English

Journal_Title

Circuits and Systems II: Analog and Digital Signal Processing, IEEE Transactions on

Publisher

ieee

ISSN

1057-7130

Type

jour

DOI

10.1109/82.532008

Filename

532008